Forthcoming Events

01.10.2020 - 01.10.2020, AkademieHotel, Karlsruhe, Germany
26.10.2020 - 28.10.2020, Paul Scherrer Institut (PSI), Villigen,Switzerland


New scientific highlights- by MUST PIs Chergui, Milne and Wörner
New scientific highlights- from MUST researchers at PSI
Promotion to full professorcongratulations to Steve Johnson!
The Laser at 60: Ursula KellerOPN interviewed OSA Fellows
Former EPFL PhD student Edoardo Baldini wins the 2020 ACS PHYS Division Young Investigator Awards
New scientific highlights- by MUST PIs Banerji, Chergui and Wolf
Prix de l'innovation AGROVINA 2020- for Agrolase: detecting spores of pathogens in real time
Ruth Signorell receives the Humboldt Prize- awarded in recognition of outstanding achievements in research and teaching

Nonlinear XUV-optical transient grating spectroscopy at the Si L2,3–edge

May 6, 2019

Nonlinear XUV-optical transient grating spectroscopy at the Si L2,3-edge: Time-resolved transient grating spectroscopy facilitates detailed studies of electron dynamics and transport phenomena by means of a periodic excitation of matter with coherent ultrashort light pulses. We demonstrated the element specificity of XUV TG (X-TG) experiments by tuning the photon energy across the Si L2,3-edge of Si3N4. We observe a shortening of the signal decay when increasing the XUV photon energy above the absorption edge. The analysis of the wavelength dependent signal shows that the faster decay is driven by the increase in the charge carrier density. From the decay constants the interband Auger coefficient at elevated temperatures and high electron densities has been determined.

(a) Scheme of the MINI-TIMER setup for performing FWM experiments. The incident XUV pulse (blue) is split (mirror M0) and combined (mirrors M1 and M2) at the sample position to be mixed with a temporally delayed optical pulse (red). The transmitted XTG signal is detected using a CCD detector. (b) X-TG signals as observed on the CCD detector and the corresponding time trace for 100 eV XUV excitation. The time delays dt for which the CCD images are shown are marked red in the time trace.

Reference: R. Bohinc, G. Pamfilidis, J. Rehault, P. Radi, C. Milne, J. Szlachetko, F. Bencivenga, F. Capotondi, R. Cucini, L. Foglia, C. Masciovecchio, R. Mincigrucci, E. Pedersoli, A. Simoncig, N. Mahne, A. Cannizzo, H.M. Frey, Z. Ollmann, T. Feurer, A.A. Maznev, K. Nelson, and G. Knopp “Nonlinear XUV-optical transient grating spectroscopy at the Si L2,3-edge”, Applied Physics Letters (
NCCR MUST Office : ETHZ IQE/ULP-HPT H3 | Auguste-Piccard-Hof 1 | 8093 Zurich | E-Mail | +41 44 633 36 02
The National Centres of Competence in Research (NCCR) are a research instrument of the Swiss National Science Foundation