Femtosecond Electron Imaging and Spectroscopy 4 (FEIS 4)
Date | Mo, 13.05.2019 - Mi, 15.05.2019 | |
Location | Lincoln, NE, USA | |
Program | The Femtosecond Electron Imaging and Spectroscopy IV (FEIS IV) conference is the fourth in a series, started in 2013 and held every two years with an emphasis on ultrafast electron sources and applications. The conference is intrinsically interdisciplinary as it brings together ultrafast science and instrument development. This conference series has been very valuable for sharing scientific and technological advances, understanding what future technological needs will be and planning how to address them. The major themes of the meeting are: · Ultrafast dynamics in condensed matter systems · Ultrafast dynamics in isolated molecules · Development and characterization of ultrafast electron diffraction and microscopy instruments · Novel ultrafast electron sources and applications · Complementary ultrafast probing methods: X-ray diffraction, ionization and rescattering based measurements, photoelectron spectroscopy. Martin Centurion, on behalf of the Scientific Committee. Fo r ad di ti on al i nf or ma ti on c on ta ct t he o rg an iz er s at f ei s4 @u nl .e du Scientific Committee Herman Batelaan, University of Nebraska Martin Centurion, University of Nebraska Jom Luiten, Eindhoven University of Technology Chong-Yu Ruan, Michigan State University Xijie Wang, SLAC National Lab Dao Xiang, Shanghai Jiao Tong University Yimei Zhu, Brookaven National Lab |
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Link | FEIS4 | |
Abstract submission |