Multilayer optics for X-ray and Extreme Ultraviolet applications
Date | Do, 15.11.2012 | |
Time | 10.15 | |
Speaker | Dr. Igor A. Artyukov, P.N.Lebedev Physical Institute, Moscow, Russia | |
Location | Universität Bern, Institut für Angewandte Physik, Gebäude exakte Wissenschaften, Hörsaal B116, Sidlerstrasse 5, 3012 Bern | |
Program | This presentation gives a review of recent achievements in the development X-ray/EUV multilayer optics and its applications in compact microscopy and spectrometry. Special attention is paid to the “carbon window” spectral region (4.5 nm < λ < 5 nm), where the carbon and carbon containing materials are extremely transparent. Another example is a table-top soft XUV microscopy at the wavelength 46.9 nm that were carried out in the Colorado State University with a compact capillary discharge laser. | |
Link | www.iap.unibe.ch |